ISBN 0-89006-516-0
Pramod Rastogi
433 pages.
Copyright 1997.
Reviews
“ This book provides a single source of up-to-date knowledge in optical metrology ranging from basic equations to practical applications. It provides a wealth of information on the essential principles and methods available today in the areas of interferometry, speckle metrology, optical testing, moiré, fiber optic sensors, optical smart sensing, holography of micro-objects, surface roughness measurement, photoelasticity, lidar, particle image velocimetry, ellipsometry, and digital photography. This book would be especially useful to electro-optical engineers and to those working with fiber optic sensors, and to those making optically based measurements.”
---IEEE Electrical Insulation Magazine, January/February 2000
Description
Significant advances in optical metrology have fueled the development of new, innovative techniques for the technology in a wide range of applications. Now you can better understand these highly accurate and versatile new methods, and gain insight into applying the technology to solve specific measurement problems.
Optical Measurement Techniques and Applications does much more than just cover the underlying principles behind the latest optical measurement techniques. With the help of hundreds of example diagrams and step-by-step equations, sixteen of the industry's leading experts quickly bring you up to speed on how these methods are used in dozens of real-world applications -- from laser remote-sensing, to vibration measurement, to providing the data necessary to develop computer models, and more. The book also prepares you to meet future optical measurement challenges by identifying what areas of research are on the horizon. And each chapter concludes with an extensive list of references for more advanced research.
This is an invaluable reference for optical researchers and practicing engineers who need sharp insight into the key optical measurement techniques and systems in use today. It's also a powerful learning resource for upper-level undergraduate and postgraduate students.
Table of Contents
Contents:
1. Introduction: Interference of Waves. Diffraction. Polarization. Speckle. Sensitivity, Accuracy, and Precision. Scope of the Text. Concluding Remarks.
2. Optical Metrology of Engineering Surfaces -- Scope and Trends: Triangulation. Projected Fringe Techniques for Industrial Inspection and Microshape Analysis. Interferometry for Precision Measurements. Interferometry on Optically Rough Surfaces. Shearing Interferometry. White-Light Interferometry for Micro- and Macrostructure Analysis. Heterodyne Interferometry. Interferometry Outside the Coherence Length. Interferometry for Microtopography and Roughness Measurements.
3. Digital Processing of Fringe Patterns in Optical Metrology: Techniques for Digital Phase Reconstruction. Measurement of Three-Dimensional Displacement Fields. Conclusion.
4. Interferometric Optical Testing: Principles of Optical Testing. Implementation and Development of Interferometric Testing Methods. Conclusion.
5. Holographic Interferometry -- An Important Tool in Nondestructive Measurement and Testing: Wavefront Reconstruction Process. Basic Methods of Wavefront Comparison. Brief Introduction to Fringe Formation and Phase Difference Measurement. Measurement of Static Deformation. Study of Vibrations. Flow Visualization. Measurement of Surface Topography. Concept of Holographic Flaw Detection. Some Examples of Application. TV Holography and Electronic Holography. Conclusions.
6. Speckle Photography, Shearography, and ESPI: Some Statistical Properties. Speckle Photography. Speckle Interferometry. Speckle-Shear Interferometry (Shearography). Contour Generation. ESPI. Summary.
7. Photoelasticity and Moire: Photoelasticity. Moire. Conclusions.
8. Optical Fiber Sensors: Intensity-Based Sensors. Distributed Sensors. Interferometric Sensors. Summary.
9. Fiber Optic Smart Sensing: Fiber Optic Smart Sensing. Smart Sensing Subsystems. Sensor Selection. Application Examples. Outlook.
10. Holographic Metrology of Micro-objects in a Dynamic Volume: Historical Background. Basic Principles of In-Line Fraunhofer Holography. System Design Parameters. Some Practical Considerations. Hologram Fringe Contrast and Its Enhancement. Nonimage Plane Analysis. Velocimetry and High-Speed Holography. Off-Axis Holography. Automated Analysis. Some Other Developments.
11. Particle Image Velocimetry: Principles. Methods of Image Analysis in PIV. Advances. Conclusions Highlighting Areas of Future Development.
12. Surface Roughness Measurement: Microscopy. Mechanical Profilers. Optical Profilers. Total Integrated Scattering. Angle-Resolved Scattering. Other Techniques. Importance of Surface Cleanliness. Future Developments.
13. Lidar for Atmospheric Remote Sensing: The Lidar Method. Lidar Systems. Conclusion.
14. Some Other Methods in Optical Metrology: Optical Caustics. Digital Image Correlation. Ellipsometry. Digital Photogrammetry.
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