ISBN 0-89006-350-8
Pollino
554 pages.
Copyright 1989.









Description

Artech House is pleased to offer you this title in a special In-Print-Forever® (IPF®) hardbound edition. This book is not available from inventory but can be printed at your request and delivered within 2-4 weeks of receipt of order. Please note that because IPF® books are printed on demand, returns cannot be accepted.

Table of Contents

The Technological Revolution and Reliability. Basics of Semiconductor Device Technology. Corrosion of Metalization. Electromigration in Thin Film Conductors. Metal-Silicon Interactions. Latch-Up in CMOS Integrated Circuits. Reliability of Compound Semiconductor Microwave Field Effect Devices. Reliability of Optoelectronic Components. Power Device Reliability. Accelerated Tests. Microanalysis Techniques. Failure Analysis and Technological Characterization. Reliability Problems and Standards.